Au/TbMnO3/YBa2 Cu3O7-x capacitors were fabricated on SrTiO3 substrates by pulse laser deposition technique, of which electric properties were investigated in the temperature range from 25 to 300 K. Both current-voltage characteristics and junction resistances with bias voltages showed remarkable temperature dependence, in which obvious thermally excited relaxation processes were found between 150 and 200 K. At the temperatures lower than the activation process, the leakage currents of the capacitors were studied. Interestingly, at high electric field, the mechanism of the leakage was Poole-Frenkel emission. However, at low electric field, the conduction was not Ohmic, and ideal lnJ∝E 1/4 characteristics were observed. Analysis showed that the possible origin was related to the inherent inhomogeneous nature of activationless percolating transport.
Polycrystalline La0.67Ba0.33MnO3 bulk samples were annealed in flowing 95%Ar：5%H2 （AH） mixed gas at 973 K for different time respectively. The influence of the annealing time on the current-voltage properties was systematically investigated. Linear current-voltage characteristics were observed in the as-prepared and the 10 h annealed samples, and nonlinear current-voltage characteristics was found in the 100 h annealed sample. At the same time, segregation of impurity phase and micro-cracks were found on the surfaces of the 100 h annealed samples, which was testified to be Ba ion impurity. Analysis showed that the changes of electronic properties were caused by barium ion im-purities and micro-cracks in the 100 h annealed sample.
